Scanning electron microscopy of plant cells using a variable pressure SEM and cryogenic techniques

• YAMADA M.

収録刊行物

• Proceedings of the 51st Annual Meeting of the Microscopy Society of America

  Proceedings of the 51st Annual Meeting of the Microscopy Society of America 260-261, 1993

  San Francisco Press, Inc

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• CRID: 1570291224727818368
• NII論文ID: 10008813741
• データソース種別:
  • CiNii Articles