Measurement of the compensation for the difference between voltage and current centres in HRTEM

• Sakumi Moriguchi

• Seiji Isoda

• Takashi Kobayashi

Journal

• Journal of electron microscopy

  Journal of electron microscopy 48 (4), 437-441, 1999

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Details

• CRID: 1523669555671165824
• NII Article ID: 10008815169
• NII Book ID: AA00697060
• ISSN: 00220744
• NDL BIB ID: 4835616
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4835616
• Text Lang: en
• NDL Source Classification:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• Data Source:
  • NDL
  • CiNii Articles