Spatial resolution of nanostructural analysis by electron energy-loss spectroscopy and energy-filtered imaging

• Raymond F. Egerton

Bibliographic Information

Other Title

• HAFN Special Issue
• HAFN Special Issue

Journal

• Journal of electron microscopy

  Journal of electron microscopy 48 (6), 711-716, 1999

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Details

• CRID: 1523951029610663168
• NII Article ID: 10008815942
• NII Book ID: AA00697060
• ISSN: 00220744
• NDL BIB ID: 4976609
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4976609
• Text Lang: en
• NDL Source Classification:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• Data Source:
  • NDL
  • CiNii Articles