A new approach to lattice parameter measurements using dynamic electron diffraction and pattern matching

• J.M. Zuo

• Miyoung Kim

• Randi Holmestad

Bibliographic Information

Other Title

• new approach to lattice parameter measu

Journal

• Journal of electron microscopy

  Journal of electron microscopy 47 (2), 121-127, 1998-04

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Details

• CRID: 1522825129993298688
• NII Article ID: 10008816725
• NII Book ID: AA00697060
• ISSN: 00220744
• NDL BIB ID: 4486062
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4486062
• Text Lang: en
• NDL Source Classification:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• Data Source:
  • NDL
  • CiNii Articles