Digital high-resolution electron microscopy of atomic disordering in YB56

• Takeo Oku

Bibliographic Information

Other Title

• Digital high resolution electron microscopy of atomic disordering in YB56
• HAFN Special Issue
• HAFN Special Issue

Journal

• Journal of electron microscopy

  Journal of electron microscopy 49 (1), 41-52, 2000

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Keywords

• atomic detection
• digital analysis

Details

• CRID: 1521699230931298816
• NII Article ID: 10008817023
• NII Book ID: AA00697060
• ISSN: 00220744
• NDL BIB ID: 5315673
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I5315673
• Text Lang: en
• NDL Source Classification:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• Data Source:
  • NDL
  • CiNii Articles