Analysis of interfaces and stress fields in lamellar TiAl/Ti_3Al by transmission electron microscopy

• HEINRICH H.

収録刊行物

• Proceedings of the Swiss-Japan Joint Seminar on Electron Microscopy in Material Sciences

  Proceedings of the Swiss-Japan Joint Seminar on Electron Microscopy in Material Sciences 53-56, 1997

  Nakanishi Printing

詳細情報

• CRID: 1574231874402076416
• NII論文ID: 10008817085
• データソース種別:
  • CiNii Articles