Characterization of lattice defects in strontium titanate single crystals by X-ray topography and transmission electron microscopy

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Other Title
  • Characterization of lattice defects in strontium titanate single crystals by X ray topography and transmission electron microscopy
  • HAFN Special Issue
  • HAFN Special Issue

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Journal

  • Journal of electron microscopy

    Journal of electron microscopy 49 (1), 89-92, 2000

    Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

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