The Imaging Mechanism of Atomic-scale Kelvin Probe Force Microscopy and its Application to Atomic-Scale Force Mapping

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Kelvin probe force microscopy (KPFM) using noncontact atomic force microscopy (NC-AFM) has been utilized for years and has achieved true atomic-scale resolution in the measurement of contact potential difference (CPD). However, the meaning of atomic-scale CPD images has not been clearly explained. In this paper, we propose a novel model which explains the imaging mechanism of atomic-scale KPFM. Our model shows that the cantilever oscillation induced by an AC electric field, which is applied for KPFM measurement, brings about the atomic resolution in CPD images. We show experimental evidence of our model by measuring the dependence of the cantilever oscillation and the frequency-shift signal on the tip-sample distance. We conclude that the CPD images reflect the interaction strength between the tip and the sample surface rather than the electrostatic force. Finally, we propose a novel method for force mapping based on our model.

収録刊行物

  • Japanese journal of applied physics. Pt. 1, Regular papers & short notes

    Japanese journal of applied physics. Pt. 1, Regular papers & short notes 42(11), 7163-7168, 2003-11-15

    公益社団法人 応用物理学会

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各種コード

  • NII論文ID(NAID)
    10012565057
  • NII書誌ID(NCID)
    AA10457675
  • 本文言語コード
    EN
  • 資料種別
    ART
  • 雑誌種別
    大学紀要
  • ISSN
    0021-4922
  • NDL 記事登録ID
    6753262
  • NDL 雑誌分類
    ZM35(科学技術--物理学)
  • NDL 請求記号
    Z53-A375
  • データ提供元
    CJP書誌  NDL  J-STAGE  JSAP 
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