Localized electron irradiation methods and their application to detection of flow-field of point defects

• ARAI Shigeo

  Center for Integrated Research in Science and Engineering, Nagoya University

• SATOH Yuhki

  Institute for Materials Research, Tohoku University

• ARAKAWA Kazuto

  Department of Material Science, Interdisciplinary Faculty of Science and Engineering Shimane University

• MORITA Chiaki

  Center for Integrated Research in Science and Engineering, Nagoya University

• KIRITANI Michio

  Department of Electronic Engineering, Hiroshima Institute of Technology

収録刊行物

• Journal of electron microscopy

  Journal of electron microscopy 53 (1), 21-27, 2004-02-01

キーワード

• ultrahigh-voltage transmission electron microscope
• electron radiation damage
• localized irradiation
• outflow point defects
• one-dimensional motion

詳細情報

• CRID: 1573105974925340160
• NII論文ID: 10012715875
• NII書誌ID: AA00697060
• ISSN: 00220744
• 本文言語コード: en
• データソース種別:
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