Area and time co-optimization for system-on-a-chip based on consecutive testability

Journal

Proc. 2003 Int. Test Conf., Sep.  

Proc. 2003 Int. Test Conf., Sep., 415-422, 2003 

Cited by:  1

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Codes

  • NII Article ID (NAID) :
    10012835688
  • Article Type :
    Proceedings
  • Databases :
    CJPref 

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