Determination of absolute thickness and mean free path of thin foil specimen by ζ-factor method

• OHSHIMA Katsunori

  Departments of Materials Science and Engineering, Faculty of Engineering, Kyushu University

• KANEKO Kenji

  Departments of Materials Science and Engineering, Faculty of Engineering, Kyushu University

• FUJITA Takeshi

  Departments of Materials Science and Engineering, Faculty of Engineering, Kyushu University

• HORITA Zenji

  Departments of Materials Science and Engineering, Faculty of Engineering, Kyushu University

収録刊行物

• Journal of electron microscopy

  Journal of electron microscopy 53 (2), 137-142, 2004-04-01

キーワード

• EDS
• EELS
• characteristic X-rays
• amorphous
• mean free path
• thickness

詳細情報

• CRID: 1573105974935160448
• NII論文ID: 10012932565
• NII書誌ID: AA00697060
• ISSN: 00220744
• 本文言語コード: en
• データソース種別:
  • CiNii Articles