Prospects of atomic resolution imaging with an aberration-corrected STEM

• Kazuo Ishizuka

書誌事項

タイトル別名

• Prospects of atomic resolution imaging with an aberration corrected STEM

収録刊行物

• Journal of electron microscopy

  Journal of electron microscopy 50 (4), 291-305, 2001

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

キーワード

• STEM
• image simulation
• high-angle annular dark-field imaging
• Cscorrection
• dynamical scattering

詳細情報

• CRID: 1523669553266057344
• NII論文ID: 10013018033
• NII書誌ID: AA00697060
• ISSN: 00220744
• NDL書誌ID: 5911368
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I5911368
• 本文言語コード: en
• NDL 雑誌分類:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• データソース種別:
  • NDL
  • CiNii Articles