Fourier analysis of HRTEM image deterioration caused by mechanical vibration

• Tadahiro Kawasaki

• Yoshihide Kimura

• Yoshizo Takai

収録刊行物

• Journal of electron microscopy

  Journal of electron microscopy 50 (5), 413-416, 2001

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

キーワード

• transmission electron microscope
• Fourier analysis
• mechanical vibration
• diffractograms of plural images
• image deterioration
• turbo molecular pump

詳細情報

• CRID: 1521136280318332672
• NII論文ID: 10013018375
• NII書誌ID: AA00697060
• ISSN: 00220744
• NDL書誌ID: 5997247
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I5997247
• 本文言語コード: en
• NDL 雑誌分類:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• データソース種別:
  • NDL
  • CiNii Articles