Effect of thermal hysteresis on residual strain of Cu stabilizer for Cu/Nb_3Sn composite conductors

• KIYAMA K.

  Department of Electrical and Electronic Engineering, Okayama University

• NANATO N.

  Department of Electrical and Electronic Engineering, Okayama University

• KIM S.

  Department of Electrical and Electronic Engineering, Okayama University

• MURASE S.

  Department of Electrical and Electronic Engineering, Okayama University

Bibliographic Information

Other Title

• Cu/Nb_3Sn線材の熱履歴の違いによる安定化銅の残留歪変化

Journal

• 低温工学・超電導学会講演概要集 = Meetings of Cryogenics and Superconductivity

  低温工学・超電導学会講演概要集 = Meetings of Cryogenics and Superconductivity 71 91-, 2004-11-01

Details

• CRID: 1572543024932330112
• NII Article ID: 10013790627
• NII Book ID: AA1195143X
• ISSN: 09195998
• Text Lang: ja
• Data Source:
  • CiNii Articles