Application of FIB microsampling technique to long-period ordered TiAl single crystal with composition gradient

• HATA Satoshi

  Department of Applied Science for Electronics and Materials

• SHIRAISHI Kohjiro

  Department of Applied Science for Electronics and Materials

• ITAKURA Masaru

  Department of Applied Science for Electronics and Materials

• KUWANO Noriyuki

  Art, Science and Technology Center for Cooperative Research, Kyushu University

• NAKANO Takayoshi

  Department of Materials Science and Engineering & Handai Frontier Research Center, Osaka University

• UMAKOSHI Yukichi

  Department of Materials Science and Engineering & Handai Frontier Research Center, Osaka University

収録刊行物

• Journal of electron microscopy

  Journal of electron microscopy 53 (5), 537-540, 2004-10-01

キーワード

• focused ion beam microsampling
• composition gradient
• TiAl
• long-period superstructure
• single crystal

詳細情報

• CRID: 1571698599861030528
• NII論文ID: 10014104265
• NII書誌ID: AA00697060
• ISSN: 00220744
• 本文言語コード: en
• データソース種別:
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