Selective Removal of Carbon Nanotubes Utilizing Low-Acceleration-Voltage Electron Irradiation Damage

• Suzuki Satoru

  NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation CREST, JST, c/o NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation

• Takagi Daisuke

  CREST, JST, c/o Department of Physics, Tokyo University of Science

• Homma Yoshikazu

  CREST, JST, c/o Department of Physics, Tokyo University of Science Department of Physics, Tokyo University of Science

• Kobayashi Yoshihiro

  NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation CREST, JST, c/o NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation

抄録

A simple method for spatially selective removal of single-walled carbon nanotubes is demonstrated. This method is based on low-acceleration-voltage electron irradiation damage and consists of local electron irradiation of nanotubes and annealing in air. The irradiation damage seems to follow excitation of valence electrons.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 44 (1-7), L133-L135, 2005

  The Japan Society of Applied Physics

キーワード

• nanotube
• low-acceleration-voltage electron
• electron irradiation damage
• selective removal

詳細情報

• CRID: 1390282681243588224
• NII論文ID: 210000059363
• NII論文ID: 10014420630
• NII書誌ID: AA11906093
• DOI: 10.1143/jjap.44.l133
• ISSN: 13474065
• ISSN: 00214922
• NDL書誌ID: 7257118
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I7257118
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.44.L133
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.44.L133/pdf
• 本文言語コード: en
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可