電子線で今何ができるか１．電子線結晶構造解析の最先端　　ＴＥＭ‐ＥＸＥＬＦＳ法の特徴とその応用の現状と展望

• 武藤 俊介

  名古屋大学大学院工学研究科マテリアル理工学専攻

書誌事項

タイトル別名

• Its Features, Applications and Future Prospects
• TEM EXELFSホウ ノ トクチョウ ト ソノ オウヨウ ノ ゲンジョウ ト テンボウ

抄録

In this short article the features of extended energy-loss fine structure (EXELFS) in electron energy-loss spectroscopy (EELS) associated with transmission electron microscopy (TEM) are introduced as one of the useful methods for structural analysis in a localized area. After briefly describing the principle and analysis method of EXELFS, several interesting application examples of EXELFS in materials science are presented. Finally the standing problems in EXELFS analysis and future prospects are addressed.

収録刊行物

• 日本結晶学会誌

  日本結晶学会誌 47 (1), 61-66, 2005

  日本結晶学会

詳細情報

• CRID: 1390282679063684864
• NII論文ID: 10014463505
• NII書誌ID: AN00188364
• DOI: 10.5940/jcrsj.47.61
• ISSN: 18845576
• ISSN: 03694585
• NDL書誌ID: 7266237
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I7266237
• 本文言語コード: ja
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
  • KAKEN
• 抄録ライセンスフラグ: 使用不可