Multi-frequency Test Access Mechanism Design for Modular SOC Testing

Journal

Proc. of IEEE the 11th Asian Test Symposium, Nov. 2004  

Proc. of IEEE the 11th Asian Test Symposium, Nov. 2004, 2004 

Cited by:  1

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Codes

  • NII Article ID (NAID) :
    10015407807
  • Article Type :
    Proceedings
  • Databases :
    CJPref 

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