Low Current Efficiency in MOX Deposition Tests

抄録

A series of MOX deposition tests has been performed since 2001 at RIAR to clarify its complex phenomena and to improve its poor current efficiency. In the 2001 tests, the cathode current efficiency was between 60 and 100% but the Pu fraction in the MOX was between 5 and 20%. In 2002 tests, the fraction was raised to more than 30% by modifying the test conditions but the current efficiency fell to between 20 and 60%. A new method was proposed to simulate the parasitic current due to the electrode reactions of UO22+/UO2+, Pu4+/Pu3+ and Fe3+/Fe2+ at the cathode. It was found that the parasitic current due to the UO22+/UO2+ reaction significantly lowers the current efficiency especially when the cathode potential is kept near the equilibrium value during the electrolysis to increase the Pu fraction in the MOX deposit.

収録刊行物

Journal of nuclear science and technology  

Journal of nuclear science and technology 42(10), 861-868, 2005-10-25 

一般社団法人 日本原子力学会

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各種コード

  • NII論文ID(NAID) :
    10016378962
  • NII書誌ID(NCID) :
    AA00703720
  • 本文言語コード :
    ENG
  • 資料種別 :
    ART
  • ISSN :
    00223131
  • NDL 記事登録ID :
    7492876
  • NDL 雑誌分類 :
    ZM35(科学技術--物理学)
  • NDL 請求記号 :
    Z53-A460
  • 収録DB :
    CJP書誌  CJP引用  NDL  J-STAGE