First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM
-
- YAMASAKI Jun
- EcoTopia Science Institute, Nagoya University
-
- SAWADA Hidetaka
- JEOL Ltd.
-
- TANAKA Nobuo
- EcoTopia Science Institute, Nagoya University
この論文をさがす
収録刊行物
-
- Journal of electron microscopy
-
Journal of electron microscopy 54 (2), 123-126, 2005-04-01
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1571135650280619520
-
- NII論文ID
- 10016683055
-
- NII書誌ID
- AA00697060
-
- ISSN
- 00220744
-
- 本文言語コード
- en
-
- データソース種別
-
- CiNii Articles