Area and time co-optimization for system-on-a-chip based on consecutive testability

Journal

IEEE International Test Conference 2003 (ITC'03), Sep.  

IEEE International Test Conference 2003 (ITC'03), Sep., 2003 

Cited by:  1

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Codes

  • NII Article ID (NAID) :
    10017115768
  • Article Type :
    Proceedings
  • Databases :
    CJPref 

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