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- 北田 正弘
- 東京芸術大学大学院美術研究科
書誌事項
- タイトル別名
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- Microstructures and Physical Properties of Colored Layer of Cu-4 mass%Au Alloy (Shakudou) Fabricated by Japanese Traditional Technique
- 伝統技法で着色したCu-4 mass%Au合金(赤銅:しゃくどう)の着色層における微細構造と物理的性質
- デントウ ギホウ デ チャクショク シタ Cu 4 massパーセントAu ゴウキン シャクドウ シャク ドウ ノ チャクショクソウ ニ オケル ビサイ コウゾウ ト ブツリテキ セイシツ
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抄録
The microstructures and physical properties of Niiro-colored Cu-4 mass%Au alloy (shakudou in Japanese) have been investigated. Specimens are fabricated by using a traditional Japanese metal-craft technique. An aqueous solution containing cupric sulfate, alum and artificial verdigris is used to color the alloy sheets. Coloring is performed at 373 K(100°C). The fine structures are observed using a transmission electron microscope. The matrix of the colored layer consists of crystalline and amorphous Cu2O and the crystal size is 30~80 nm. The relation Cu2O{111}//Cu-Au{111} is observed between the grown Cu2O and the matrix Cu-Au alloy. The Au fine particles with 2-5 nm diameters are distributed in the Cu2O layer. Many impurities of Cl and S introduced from the coloring solution are detected from the top of the colored layer by AES analysis. The reflectance of the colored specimen is approximately 5% of the uncolored alloy and a broad reflection peak near 450 nm is observed. The threshold voltage of Cu2O/Cu-Au alloy contact for the colored specimen is 0.2-0.3 V. This is approximately 1/3 of that of thermally oxidized Cu2O /Cu-Au alloy contact. The coloring is mainly due to light absorption and reflection by the fine Au particles distributed in the Cu2O layer.<br>
収録刊行物
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- 日本金属学会誌
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日本金属学会誌 69 (12), 1069-1076, 2005
公益社団法人 日本金属学会
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キーワード
詳細情報
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- CRID
- 1390001206479587584
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- NII論文ID
- 10017152744
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- NII書誌ID
- AN00187860
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- ISSN
- 18806880
- 24337501
- 00214876
- http://id.crossref.org/issn/00214426
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- NDL書誌ID
- 7789003
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可