Single-Electron Simulators for High and Low Level Analyses

• FUJISHIMA M.

  VLSI Design and Education Center, University of Tokyo

• AMAKAWA S.

  VLSI Design and Education Center, University of Tokyo

• HOH K.

  VLSI Design and Education Center, University of Tokyo

収録刊行物

• Extended abstracts of the ... Conference on Solid State Devices and Materials

  Extended abstracts of the ... Conference on Solid State Devices and Materials 1997 308-309, 1997-09-16

詳細情報

• CRID: 1573950399980404352
• NII論文ID: 10017194863
• NII書誌ID: AA10777858
• 本文言語コード: en
• データソース種別:
  • CiNii Articles