Can ZnO Eat Market in Optoelectronic Applications?
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- KAWASAKI M.
- Department of Innovative and Engineered Materials, Tokyo Institute of Technology
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- TAMURA K.
- Department of Innovative and Engineered Materials, Tokyo Institute of Technology
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- SAIKUSA K.
- Department of Innovative and Engineered Materials, Tokyo Institute of Technology
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- AITA T.
- Department of Innovative and Engineered Materials, Tokyo Institute of Technology
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- TSUKAZAKI A.
- Department of Innovative and Engineered Materials, Tokyo Institute of Technology
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- OHTOMO A.
- Department of Innovative and Engineered Materials, Tokyo Institute of Technology
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- JIN Z. G.
- Department of Innovative and Engineered Materials, Tokyo Institute of Technology
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- MATSUMOTO Y.
- Department of Innovative and Engineered Materials, Tokyo Institute of Technology
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- FUKUMURA T.
- Department of Innovative and Engineered Materials, Tokyo Institute of Technology
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- KOINUMA H.
- Department of Innovative and Engineered Materials, Tokyo Institute of Technology
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- OHMAKI Y.
- Research Institute of Electronic Communication, Tohoku University
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- KISHIMOTO S.
- Research Institute of Electronic Communication, Tohoku University
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- OHNO Y.
- Research Institute of Electronic Communication, Tohoku University
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- MATSUKURA F.
- Research Institute of Electronic Communication, Tohoku University
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- OHNO H.
- Research Institute of Electronic Communication, Tohoku University
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- MAKINO T.
- Photodynamics Research Center, RIKEN
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- TUAN N. T.
- Photodynamics Research Center, RIKEN
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- SUN H. D.
- Photodynamics Research Center, RIKEN
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- CHIA C. H.
- Photodynamics Research Center, RIKEN
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- SEGAWA Y.
- Photodynamics Research Center, RIKEN
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- TANG Z. K.
- Department of Physics, The Hong Kong University of Science and Technology
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- WANG G. K. L.
- Department of Physics, The Hong Kong University of Science and Technology
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収録刊行物
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- Extended abstracts of the ... Conference on Solid State Devices and Materials
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Extended abstracts of the ... Conference on Solid State Devices and Materials 2000 128-129, 2000-08-28
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詳細情報 詳細情報について
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- CRID
- 1573668925003748992
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- NII論文ID
- 10017197633
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- NII書誌ID
- AA10777858
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- 本文言語コード
- en
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