C-V Characteristics of ZnO Thin-Film Field Effect Transistor Structures Formed on Glass Substrates
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- OHMAKI Y.
- Laboratory for Electronic Intelligent Systems, Research Institute of Electric Communication Tohoku University
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- KISHIMOTO S.
- Laboratory for Electronic Intelligent Systems, Research Institute of Electric Communication Tohoku University
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- OHNO Y.
- Laboratory for Electronic Intelligent Systems, Research Institute of Electric Communication Tohoku University
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- MATSUKURA F.
- Laboratory for Electronic Intelligent Systems, Research Institute of Electric Communication Tohoku University
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- OHNO H.
- Laboratory for Electronic Intelligent Systems, Research Institute of Electric Communication Tohoku University
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- SAIKUSA K.
- Department of Innovative and Engineered Materials, Tokyo Institute of Technology
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- AITA T.
- Department of Innovative and Engineered Materials, Tokyo Institute of Technology
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- OHTOMO A.
- Department of Innovative and Engineered Materials, Tokyo Institute of Technology
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- KAWASAKI M.
- Department of Innovative and Engineered Materials, Tokyo Institute of Technology
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収録刊行物
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- Extended abstracts of the ... Conference on Solid State Devices and Materials
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Extended abstracts of the ... Conference on Solid State Devices and Materials 2000 132-133, 2000-08-28
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- CRID
- 1570009750306505088
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- NII論文ID
- 10017197647
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- NII書誌ID
- AA10777858
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- 本文言語コード
- en
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