Materials characterization in the aberration-corrected scanning transmission electron microscope
収録刊行物
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- Ann. Rev. Mater. Res.
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Ann. Rev. Mater. Res. 35 539-569, 2005
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詳細情報
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- CRID
- 1570291225408952832
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- NII論文ID
- 10018006135
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- データソース種別
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- CiNii Articles
- KAKEN