Analysis of magnetic microstructure in MRAM bits by electron holography and Lorentz microscopy

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著者

    • PARK Jong-Bong
    • Analytical Engineering Center, Samsung Advanced Institute of Technology
    • PARK Gyeong-Su
    • Analytical Engineering Center, Samsung Advanced Institute of Technology
    • SONG In-Yong
    • Analytical Engineering Center, Samsung Advanced Institute of Technology
    • BAE Jun-Soo
    • Process Development Team, Memory Division, Samsung Electronics Co., Ltd
    • LEE Jang-Eun
    • Process Development Team, Memory Division, Samsung Electronics Co., Ltd
    • YOO Jeong-Ho
    • Institute of multidisciplinary Research for Advanced Materials, Tohoku University
    • MURAKAMI Yasukazu
    • Institute of multidisciplinary Research for Advanced Materials, Tohoku University
    • SHINDO Daisuke
    • Institute of multidisciplinary Research for Advanced Materials, Tohoku University

収録刊行物

  • Journal of electron microscopy  

    Journal of electron microscopy 55(1), 17-21, 2006-01-01 

参考文献:  19件

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各種コード

  • NII論文ID(NAID)
    10018006169
  • NII書誌ID(NCID)
    AA00697060
  • 本文言語コード
    ENG
  • 資料種別
    ART
  • ISSN
    00220744
  • データ提供元
    CJP書誌 
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