Surface damages on FIB prepared TEM-specimens : possibilities of avoidance, removal

• ARNOLD B

収録刊行物

• Microsc. Microanal.

  Microsc. Microanal. 9 (0), 140-141, 2003

詳細情報

• CRID: 1573105975176058112
• NII論文ID: 10018006197
• データソース種別:
  • CiNii Articles