原子間力顕微鏡を用いた高分子表面のナノ力学物性解析 Nanomechanical Property Analysis of Polymer Surfaces by Atomic Force Microscopy

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著者

    • 藤波 想 FUJINAMI So
    • 東京工業大学大学院理工学研究科有機・高分子物質専攻 Department of Organic and Polymeric Materials, Graduate School of Science and Engineering, Tokyo Institute of Technology
    • 額賀 英幸 NUKAGA Hideyuki
    • 東京工業大学大学院理工学研究科有機・高分子物質専攻 Department of Organic and Polymeric Materials, Graduate School of Science and Engineering, Tokyo Institute of Technology
    • 中嶋 健 [他] NAKAJIMA Ken
    • 東京工業大学大学院理工学研究科有機・高分子物質専攻 Department of Organic and Polymeric Materials, Graduate School of Science and Engineering, Tokyo Institute of Technology
    • 西 敏夫 NISHI Toshio
    • 東京工業大学大学院理工学研究科有機・高分子物質専攻 Department of Organic and Polymeric Materials, Graduate School of Science and Engineering, Tokyo Institute of Technology

抄録

Atomic force microscopy (AFM) is now recognized as one of the major tools to investigate the structural and mechanical properties of polymer surfaces. We were particularly interested in information obtained from force-distance curves of rubbery or melt state samples. By analyzing the force-distance curves, the sample deformation by the force applied on the surface and the resultant real height free from sample deformation were estimated. The force-distance curves also gave us Young's modulus by analyzing curves with Hertz theory. Thus, when force-distance curve measurements were performed on every point of the sample (force-volume measurements), we could obtain a sample deformation image, a real height image, and a Young's modulus image simultaneously. We demonstrated the application of this method on the blend of unvulcanized natural rubber and ethylene-propylene diene elastmer.

収録刊行物

  • 表面科学 = Journal of The Surface Science Society of Japan  

    表面科学 = Journal of The Surface Science Society of Japan 27(9), 530-534, 2006-09-10 

    The Surface Science Society of Japan

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各種コード

  • NII論文ID(NAID)
    10018051712
  • NII書誌ID(NCID)
    AN00334149
  • 本文言語コード
    JPN
  • 資料種別
    ART
  • ISSN
    03885321
  • NDL 記事登録ID
    8091040
  • NDL 雑誌分類
    ZM35(科学技術--物理学)
  • NDL 請求記号
    Z15-379
  • データ提供元
    CJP書誌  CJP引用  NDL  J-STAGE 
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