Micro-quantitative Analysis of Asbestos-A Highly Sensitive Analysis Using Analytical Electron Microscopy-

• Kohyama Norihiko

  Faculty of Economics, Toyo University

Bibliographic Information

Other Title

• アスベスト廃棄物対策　　アスベストの微量分析―電子顕微鏡法を中心に―
• アスベスト ノ ビリョウ ブンセキ デンシ ケンビキョウホウ オ チュウシン ニ
• —A Highly Sensitive Analysis Using Analytical Electron Microscopy—
• ―電子顕微鏡法を中心に―

Abstract

Asbestos had been utilized throughout the 20^thcentury as an extremely useful raw material in the construction of buildings and industrial facilities. However, due to the recognition of its carcinogenic effects, the use of asbestos has been banned in most developed countries around the world since 2005. For a long time, humans were able to use asbestos for every possible area of their lives in a safe and comfortable way, however due to a failure in developing safe utilization methods for asbestos, its use must now be banned. Asbestos-related diseases increased well into the middle of the 21^stcentury as workers were exposed to asbestos doing various kinds of work in buildings where asbestos had been used.<BR>Presently, the government of Japan is urgently putting into effect various rules to countermeasure current asbestos problems and those that may occur in the future. Specifically, in order to prevent new asbestos exposure cases among workers who demolish and repair buildings, theOrdinance on the Prevention of Hazards Due to Asbestoswas issued in 2005 under the Industrial Safety and Health Law. Microanalysis of asbestos is important in determining asbestos levels in air samples and bulk samples such as construction materials and natural minerals. Sample preparation methods for phase contrast microscopy, dispersion staining microscopy, analytical electron microscopy and X-ray diffraction analysis are introduced in this paper.

Journal

• Waste Management Research

  Waste Management Research 17 (5), 263-270, 2006

  Japan Society of Material Cycles and Waste Management

Keywords

• asbestos
• X-ray diffraction analysis
• phase contrast microscopy
• dispersion staining microscopy
• analytical electron microscopy
• demolishing and repair of buildings

Details

• CRID: 1390282679391464064
• NII Article ID: 10018107306
• NII Book ID: AN10414674
• DOI: 10.3985/wmr.17.263
• ISSN: 18838960
• ISSN: 09170855
• NDL BIB ID: 8519916
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I8519916
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed