小型精巣突然変異マウス(Smt)の精子形成異常及び小型精巣に関与するQTLsの検出 Detection of Quantitative Trait Loci Causing Abnormal Spermatogenesis and Reduced Testis Weight in the Small Testis (Smt) Mutant Mouse

この論文にアクセスする

この論文をさがす

著者

    • 趙 衛東 [他] ZHAO Wei Dong
    • Laboratory of Animal Genetics and Breeding, Department of Animal Science, College of Animal Husbandry and Veterinary Medicine, Henan Agricultural University
    • ISHIKAWA Akira
    • Division of Applied Genetics and Physiology, Graduate School of Bioagricultural Sciences, Nagoya University

抄録

The small testis (Smt) mutant mouse is characterized by a small testis of one third to one half the size of a normal testis, and its spermatogenesis is mostly arrested at early stages of meiosis, although a small number of spermatocytes at the late prophase of meiosis and a few spermatids can sometimes be seen. We performed quantitative trait locus (QTL) analysis of these spermatogenic traits and testis weight using 221 F2 males obtained from a cross between Smt and MOM (<i>Mus musculus molossinus</i>) mice. At the genome-wide 5% level, we detected two QTLs affecting meiosis on chromosomes 4 and 13, and two QTLs for paired testis weight as a percentage of body weight on chromosomes 4 and X. In addition, we found several QTLs for degenerated germ cells and multinuclear giant cells on chromosomes 4, 7 and 13. Interestingly, for cell degeneration, the QTL on chromosome 13 interacted epistatically with the QTL on chromosome 4. These results reveal polygenic participation in the abnormal spermatogenesis and small testis size in the Smt mutant.<br>

収録刊行物

  • Experimental animals  

    Experimental animals 55(2), 97-108, 2006-04-01 

    Japanese Association for Laboratory Animal Science

参考文献:  35件

参考文献を見るにはログインが必要です。ユーザIDをお持ちでない方は新規登録してください。

各種コード

  • NII論文ID(NAID)
    10018114639
  • NII書誌ID(NCID)
    AA11032321
  • 本文言語コード
    ENG
  • 資料種別
    ART
  • ISSN
    13411357
  • NDL 記事登録ID
    7881091
  • NDL 雑誌分類
    ZS7(科学技術--医学)
  • NDL 請求記号
    Z54-H752
  • データ提供元
    CJP書誌  NDL  J-STAGE 
ページトップへ