Wavelet-Based Image Enhancement for Defect Detection in Thin Film Transistor Liquid Crystal Display Panel

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This paper proposes a wavelet-based prepossessing method to improve the detecting capacity of a blob-Mura-defect-detecting algorithm. The non-uniformity of the background region is eliminated by replacing the approximation coefficients with a constant value, and the brightness difference between the background region and defect regions is increased by multiplying the detail coefficients and a weighting factor. The proposed method can perfectly control the detectable defect level by properly selecting the defect detecting level. Experimental results demonstrate that the proposed method can effectively enhance blob-Mura defects in thin film transistor liquid crystal display panels.

収録刊行物

  • Japanese journal of applied physics. Pt. 1, Regular papers & short notes

    Japanese journal of applied physics. Pt. 1, Regular papers & short notes 45(6A), 5069-5072, 2006-06-15

    Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics

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各種コード

  • NII論文ID(NAID)
    10018148670
  • NII書誌ID(NCID)
    AA10457675
  • 本文言語コード
    EN
  • 資料種別
    ART
  • 雑誌種別
    大学紀要
  • ISSN
    0021-4922
  • NDL 記事登録ID
    7941044
  • NDL 雑誌分類
    ZM35(科学技術--物理学)
  • NDL 請求記号
    Z53-A375
  • データ提供元
    CJP書誌  NDL  JSAP 
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