Wavelet-Based Image Enhancement for Defect Detection in Thin Film Transistor Liquid Crystal Display Panel

• Young-Chul Song

• Doo-Hyun Choi

• Kil-Houm Park

Bibliographic Information

Other Title

• Wavelet Based Image Enhancement for Defect Detection in Thin Film Transistor Liquid Crystal Display Panel

Abstract

コレクション : 国立国会図書館デジタルコレクション > デジタル化資料 > 雑誌

Journal

• Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP

  Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP 45 (6A), 5069-5072, 2006-06

  Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics

Keywords

• wavelet-based preprocessing
• blob-Mura-defect detection
• TFT-LCD panel

Details

• CRID: 1520290882719012480
• NII Article ID: 10018148670
• NII Book ID: AA10457675
• ISSN: 00214922
• ISSN: 13474065
• DOI: 10.1143/jjap.45.5069
• NDL BIB ID: 7941044
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I7941044
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.45.5069
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.45.5069/pdf
• Text Lang: en
• NDL Source Classification:
  • ZM35(科学技術--物理学)
• Data Source:
  • NDL
  • Crossref
  • CiNii Articles