Time-of-Flight Secondary Mass Spectrometry Analysis of Isotope Composition for Measurement of Self-Diffusion Coefficient
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The analysis of isotope ratio in a material consisting of a single element was developed as a fundamental technique to determine a self-diffusion coefficient in a melt based on time-of-flight secondary mass spectrometry (TOF-SIMS). The self-diffusion coefficient for a pure Ge melt was measured using the stable isotope 73Ge as a tracer under a homogeneous static magnetic field in order to evaluate the influence of thermal convection upon isotope distribution. The results obtained showed that the magnetohydrodynamic effect in the melt obviously damped the convection, but it was not strong enough for the self-diffusion measurement.
- Jpn J Appl Phys
Jpn J Appl Phys 45(6A), 5274-5276, 2006-06-15
INSTITUTE OF PURE AND APPLIED PHYSICS