Effective Work Function of Scandium Nitride Gate Electrodes on SiO_2 and HfO_2

この論文をさがす

著者

    • YANG Hyundoek
    • Department of Materials Science and Engineering, Gwangju Institute of Science and Technology
    • HEO Sungho
    • Department of Materials Science and Engineering, Gwangju Institute of Science and Technology
    • LEE Dongkyu
    • Department of Materials Science and Engineering, Gwangju Institute of Science and Technology
    • CHOI Sangmoo
    • Department of Materials Science and Engineering, Gwangju Institute of Science and Technology
    • HWANG Hyunsang
    • Department of Materials Science and Engineering, Gwangju Institute of Science and Technology

収録刊行物

  • Japanese journal of applied physics. Pt. 2, Letters  

    Japanese journal of applied physics. Pt. 2, Letters 45(1), L83-L85, 2006-01-25 

参考文献:  22件

参考文献を見るにはログインが必要です。ユーザIDをお持ちでない方は新規登録してください。

キーワード

各種コード

  • NII論文ID(NAID)
    10018159721
  • NII書誌ID(NCID)
    AA10650595
  • 本文言語コード
    ENG
  • 資料種別
    SHO
  • ISSN
    00214922
  • データ提供元
    CJP書誌 
ページトップへ