High-Contrast Imaging of Nano-Channels Using Reflection Near-Field Scanning Optical Microscope Enhanced by Optical Interference

• SAKAI Masaru

  Near-Field Optics Group, Kanagawa Academy of Science and Technology (KAST)

• MONONOBE Shuji

  Near-Field Optics Group, Kanagawa Academy of Science and Technology (KAST)

• AKIBA Shusaku

  Materials and Structures Laboratory, Tokyo Institute of Technology

• MATSUDA Akifumi

  Materials and Structures Laboratory, Tokyo Institute of Technology

• HARA Wakana

  Materials and Structures Laboratory, Tokyo Institute of Technology

• YOSHIMOTO Mamoru

  Materials and Structures Laboratory, Tokyo Institute of Technology

• SAIKI Toshiharu

  Near-Field Optics Group, Kanagawa Academy of Science and Technology (KAST)

Journal

• Opt. Rev.

  Opt. Rev. 13 (4), 266-268, 2006-08-01

Keywords

• near-field scanning optical microscope
• illumination-collection mode
• aperture probe
• optical interference
• high resolution imaging
• high contrast imaging
• nano-channel

Details

• CRID: 1571698600292732288
• NII Article ID: 10018209603
• NII Book ID: AA11029291
• ISSN: 13406000
• Text Lang: en
• Data Source:
  • CiNii Articles