Development of a "Built-in" Scanning Near Field Microscope Head for an Atomic Force Microscope System and Stress Mapping of an Al_2O_3/ZrO_2 Eutectic Composite

• NAKAGAWA Tatsuo

  UNISOKU Co., Ltd.

• FUKURA Satoshi

  Geochemical Laboratory, Graduate School of Science, The University of Tokyo

• NAKAI Munenori

  Department of Earth and Planetary Science, Graduate School of Science, The University of Tokyo

• SUGIYAMA Kazumasa

  Department of Earth and Planetary Science, Graduate School of Science, The University of Tokyo

• KOKAWA Ryohei

  Shimadzu Corp.

• KAGI Hiroyuki

  Geochemical Laboratory, Graduate School of Science, The University of Tokyo

収録刊行物

• Optical review

  Optical review 13 (4), 269-275, 2006-08-01

キーワード

• SNOM
• AFM
• mapping of spectral parameters
• stress mapping
• Al_2O_3
• ZrO_2 eutectic composite

詳細情報

• CRID: 1571980075269443840
• NII論文ID: 10018209615
• NII書誌ID: AA11029291
• ISSN: 13406000
• 本文言語コード: en
• データソース種別:
  • CiNii Articles