CdS-Doped Glass as Dosimetric Material with Electron Spin Resonance

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著者

    • Miyoshi Tadaki Miyoshi Tadaki
    • Department of Electrical and Electronic Engineering, Faculty of Engineering, Yamaguchi University, Tokiwadai, Ube, Yamaguchi 755-8611, Japan
    • Migita Kouto Migita Kouto
    • Division of Chemistry, Department of Chemistry and Earth Sciences, Faculty of Science, Yamaguchi University, Yoshida, Yamaguchi 753-8512, Japan
    • Tokuda Nobuko
    • Department of Human Science, Yamaguchi University, School of Medicine, Minami-Kogushi, Ube, Yamaguchi 755-8505, Japan
    • Fukumoto Tetsuo
    • Department of Human Science, Yamaguchi University, School of Medicine, Minami-Kogushi, Ube, Yamaguchi 755-8505, Japan
    • Kaneda Teruhisa
    • Ube National College of Technology, Tokiwadai, Ube, Yamaguchi 755-8555, Japan

抄録

Electron spin resonance (ESR) spectra have been measured in X-ray-irradiated CdS-doped glass as functions of X-ray dose and effective X-ray energy. The intensity of the ESR signal is proportional to X-ray dose up to 40 Gy. CdS-doped glass is more sensitive than a commercial alanine dosimeter. The intensity of the ESR signal decreases with decreasing effective X-ray energy for energies lower than 33 keV. Thermal stability was also studied. The ESR signal is relatively stable at room temperature.

Electron spin resonance (ESR) spectra have been measured in X-ray-irradiated CdS-doped glass as functions of X-ray dose and effective X-ray energy. The intensity of the ESR signal is proportional to X-ray dose up to 40 Gy. CdS-doped glass is more sensitive than a commercial alanine dosimeter. The intensity of the ESR signal decreases with decreasing effective X-ray energy for energies lower than 33 keV. Thermal stability was also studied. The ESR signal is relatively stable at room temperature.

収録刊行物

  • Japanese journal of applied physics. Pt. 1, Regular papers & short notes  

    Japanese journal of applied physics. Pt. 1, Regular papers & short notes 45(9A), 7105-7107, 2006-09-15 

    応用物理学会

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各種コード

  • NII論文ID(NAID)
    10018246508
  • NII書誌ID(NCID)
    AA10457675
  • 本文言語コード
    EN
  • 資料種別
    SHO
  • 雑誌種別
    大学紀要
  • ISSN
    0021-4922
  • NDL 記事登録ID
    8056616
  • NDL 雑誌分類
    ZM35(科学技術--物理学)
  • NDL 請求記号
    Z53-A375
  • データ提供元
    CJP書誌  NDL  IR  JSAP 
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