X-ray Diffraction Measurement of GaInNAs/GaAS Double Quantum Well Structures with Novel Analysis Method for Broadening Factors

• Kiichi Nakashima

• Kouta Tateno

Bibliographic Information

Other Title

• X ray Diffraction Measurement of GaInNAs GaAS Double Quantum Well Structures with Novel Analysis Method for Broadening Factors

Abstract

コレクション : 国立国会図書館デジタルコレクション > デジタル化資料 > 雑誌

Journal

• Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP

  Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP 45 (9A), 7167-7174, 2006-09

  Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics

Keywords

• X-ray diffraction analysis
• GaInNAs/GaAS double quantum Wells
• analysis method for broadening factor
• satellite peak profiles
• structural deterioration
• defect generation
• strain

Details

• CRID: 1520853832621214080
• NII Article ID: 10018246702
• NII Book ID: AA10457675
• ISSN: 00214922
• ISSN: 13474065
• DOI: 10.1143/jjap.45.7167
• NDL BIB ID: 8056909
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I8056909
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.45.7167
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.45.7167/pdf
• Text Lang: en
• NDL Source Classification:
  • ZM35(科学技術--物理学)
• Data Source:
  • NDL
  • Crossref
  • CiNii Articles