A Report on the SMAM-2 (Second International Symposium on Standard Materials and Metrology for Nanotechnology)

• TAKAHATA Keiji

  National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology

Bibliographic Information

Other Title

• SMAM-2(ナノテクノロジーのための標準物質と計測技術に関する第2回国際シンポジウム)参加報告

Journal

• エアロゾル研究 = Journal of aerosol research

  エアロゾル研究 = Journal of aerosol research 21 (3), 257-258, 2006-09-20

Details

• CRID: 1570854175415158784
• NII Article ID: 10018250363
• NII Book ID: AN10041511
• ISSN: 09122834
• Text Lang: ja
• Data Source:
  • CiNii Articles