X-ray Diffraction Analysis of the Recrystallization Behavior of SiCw/Al Composite at High Temperature

• Jiang Chuan-hai

  School of Materials Science and Engineering, Shanghai Jiao Tong University

• Ye Chang-qing

  School of Materials Science and Engineering, Shanghai Jiao Tong University

• Hong Bo

  School of Materials Science and Engineering, Shanghai Jiao Tong University

書誌事項

タイトル別名

• X-ray Diffraction Analysis of the Recrystallization Behavior of SiC<SUB>w</SUB>/Al Composite at High Temperature

抄録

By using the method of in-situ X-ray diffraction and profile analysis, the variation of grain size and microstrain of the cold-rolled SiC_w/Al composite at high temperature was measured, and the recrystallization behavior of the composite was investigated. Test results showed that the activation energy of grain growth after recrystallization and recovery at higher temperature of matrix in composite is close to the activation energy for self-diffusion of pure Al. It was verified that the recovery phenomenon was accompanied with the grain growth, and the whiskers cannot affect the grain growth and recovery of matrix in composite at higher temperature.

収録刊行物

• MATERIALS TRANSACTIONS

  MATERIALS TRANSACTIONS 46 (10), 2125-2128, 2005

  公益社団法人 日本金属学会

キーワード

• SiC<SUB>w</SUB>/aluminum composite
• recrystallization
• X-ray diffraction

詳細情報

• CRID: 1390001204250906496
• NII論文ID: 130004452599
• NII論文ID: 10018277405
• NII書誌ID: AA1151294X
• DOI: 10.2320/matertrans.46.2125
• ISSN: 13475320
• ISSN: 13459678
• NDL書誌ID: 7487682
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I7487682
• Web Site: https://www.jstage.jst.go.jp/article/matertrans/46/10/46_10_2125/_pdf
• 本文言語コード: en
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