Introduction to Synchrotron Radiation X-ray Analysis for Crystallographers

• NAKAI Izumi

  Dept. of Appl. Chem., Tokyo Univ. of Science

Bibliographic Information

Other Title

• こんなことができる放射光（７）分析科学分野における放射光結晶学―微小部分析，微量分析の極限にむけて
• コンナ コト ガ デキル ホウシャコウ 7 ブンセキ カガク ブンヤ ニ オケル ホウシャコウ ケッショウガク ビショウブ ブンセキ ビリョウ ブンセキ ノ キョクゲン ニ ムケテ

Abstract

This article gives an overview of several basic synchrotron radi-ation (SR) X-ray analytical techniques useful for crystallographers for material characterization. They include X-ray fluorescence analysis, X-ray powder diffraction and in plane diffraction analyses, X-ray absorption fine structure analysis and X-ray photoelectron spectroscopy. Utilization of X-ray microbeam and total reflection optics are two key elements of the techniques. Special attention was paid to show the advantage of the introduction of SR to these techniques and to give a hint of SR experiments for those who have never used SR although they have basic knowledge of the techniques.

Journal

• Nihon Kessho Gakkaishi

  Nihon Kessho Gakkaishi 47 (5), 305-315, 2005

  The Crystallographic Society of Japan

Details

• CRID: 1390282679064381568
• NII Article ID: 10018280334
• NII Book ID: AN00188364
• DOI: 10.5940/jcrsj.47.305
• ISSN: 18845576
• ISSN: 03694585
• NDL BIB ID: 7717704
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I7717704
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed