Ultrahigh Vacuum Non-Contact Atomic Force Microscope Observation of Reconstructed Si(110) Surface

• Miyachi Akihira

  Department of Nano-Material Systems, Graduate School of Engineering, Gunma University

• Sone Hayato

  Department of Nano-Material Systems, Graduate School of Engineering, Gunma University

• Hosaka Sumio

  Department of Nano-Material Systems, Graduate School of Engineering, Gunma University

抄録

We tried to observe a reconstructed Si(110) surface using an ultrahigh-vacuum (UHV) non-contact atomic force microscope (NC-AFM). The Si(110) surface has several characteristic structures, such as the 16×2, (17, 15, 1) 2×1, 1×1, zigzag structures. We succeeded in the AFM observation of the surface formed upon annealing the samples in direct current heating so as to clean the surface. We obtained the same structures in the AFM observation as the proposed 16×2 model of a Si(110) reconstruction in a STM observation. The UHV NC-AFM results demonstrate that the Si(110) surface has a characteristic 16×2 structure for the first time observation.

収録刊行物

• MATERIALS TRANSACTIONS

  MATERIALS TRANSACTIONS 47 (10), 2595-2598, 2006

  公益社団法人 日本金属学会

キーワード

• ultrahigh-vacuum
• non-contact atomic force microscope
• Silicon (110)
• 16×2
• (17
• 15
• 1) 2×1
• 32×2

詳細情報

• CRID: 1390001204250687616
• NII論文ID: 10018310541
• NII書誌ID: AA1151294X
• DOI: 10.2320/matertrans.47.2595
• ISSN: 13475320
• ISSN: 13459678
• NDL書誌ID: 8092439
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I8092439
• Web Site: https://www.jstage.jst.go.jp/article/matertrans/47/10/47_10_2595/_pdf
• 本文言語コード: en
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可