Ultrahigh Vacuum Non-Contact Atomic Force Microscope Observation of Reconstructed Si(110) Surface

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抄録

We tried to observe a reconstructed Si(110) surface using an ultrahigh-vacuum (UHV) non-contact atomic force microscope (NC-AFM). The Si(110) surface has several characteristic structures, such as the 16×2, (17, 15, 1) 2×1, 1×1, zigzag structures. We succeeded in the AFM observation of the surface formed upon annealing the samples in direct current heating so as to clean the surface. We obtained the same structures in the AFM observation as the proposed 16×2 model of a Si(110) reconstruction in a STM observation. The UHV NC-AFM results demonstrate that the Si(110) surface has a characteristic 16×2 structure for the first time observation.

収録刊行物

  • Materials transactions  

    Materials transactions 47(10), 2595-2598, 2006-10-20 

    公益社団法人 日本金属学会

参考文献:  21件

各種コード

  • NII論文ID(NAID)
    10018310541
  • NII書誌ID(NCID)
    AA1151294X
  • 本文言語コード
    ENG
  • 資料種別
    SHO
  • ISSN
    13459678
  • NDL 記事登録ID
    8092439
  • NDL 雑誌分類
    ZP41(科学技術--金属工学・鉱山工学)
  • NDL 請求記号
    Z53-J286
  • データ提供元
    CJP書誌  NDL  J-STAGE 
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