Ultrahigh Vacuum Non-Contact Atomic Force Microscope Observation of Reconstructed Si(110) Surface

• Miyachi Akihira

  Department of Nano-Material Systems, Graduate School of Engineering, Gunma University

• Sone Hayato

  Department of Nano-Material Systems, Graduate School of Engineering, Gunma University

• Hosaka Sumio

  Department of Nano-Material Systems, Graduate School of Engineering, Gunma University

Abstract

We tried to observe a reconstructed Si(110) surface using an ultrahigh-vacuum (UHV) non-contact atomic force microscope (NC-AFM). The Si(110) surface has several characteristic structures, such as the 16×2, (17, 15, 1) 2×1, 1×1, zigzag structures. We succeeded in the AFM observation of the surface formed upon annealing the samples in direct current heating so as to clean the surface. We obtained the same structures in the AFM observation as the proposed 16×2 model of a Si(110) reconstruction in a STM observation. The UHV NC-AFM results demonstrate that the Si(110) surface has a characteristic 16×2 structure for the first time observation.

Journal

• MATERIALS TRANSACTIONS

  MATERIALS TRANSACTIONS 47 (10), 2595-2598, 2006

  The Japan Institute of Metals and Materials

Keywords

• ultrahigh-vacuum
• non-contact atomic force microscope
• Silicon (110)
• 16×2
• (17
• 15
• 1) 2×1
• 32×2

Details

• CRID: 1390001204250687616
• NII Article ID: 10018310541
• NII Book ID: AA1151294X
• DOI: 10.2320/matertrans.47.2595
• ISSN: 13475320
• ISSN: 13459678
• NDL BIB ID: 8092439
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I8092439
• Web Site: https://www.jstage.jst.go.jp/article/matertrans/47/10/47_10_2595/_pdf
• Text Lang: en
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed