Application of Total Reflection X-ray Fluorescence Spectrometry to Small Glass Fragments
-
- NISHIWAKI Yoshinori
- Forensic Science Laboratory, Hyogo Prefectural Police Headquarters
-
- SHIMOYAMA Masahiko
- Forensic Science Laboratory, Hyogo Prefectural Police Headquarters
-
- NAKANISHI Toshio
- Forensic Science Laboratory, Hyogo Prefectural Police Headquarters
-
- NINOMIYA Toshio
- Japan Synchrotron Radiation Institute
-
- NAKAI Izumi
- Department of Applied Chemistry, Faculty of Science, Tokyo University of Science
この論文をさがす
抄録
Total reflection X-ray fluorescence spectrometry (TXRF) has been applied for trace elemental analysis of small glass fragments. A small glass sample (a fragment with weight less than 0.5 mg) was decomposed by 100 µg of HF/HNO3 acid; the material was condensed to 10 µl and was dried on a Si wafer. Since the size of the dried residue on the Si wafer was less than 1 cm in diameter, an incident X-ray beam with about 1 cm in width could effectively excite elemental components in such a small glass fragment. The precision of the present technique was checked by analyzing the glass fragments (< 0.5 mg) from NIST SRM612; the relative standard deviations (RSD) of less than 8.1% were achieved for elemental ratios that were normalized by Sr. Fragments (< 0.5 mg) obtained from 23 figured sheet glasses were used as samples for estimating the utility of this technique to forensic discrimination. Comparison of five elemental ratios of Ti/Sr, Mn/Sr, Zn/Sr, Rb/Sr, and Pb/Sr calculated from X-ray fluorescence spectra was effective in distinguishing glass fragments that could not be differentiated by their refractive indexes (RI).
収録刊行物
-
- Analytical Sciences
-
Analytical Sciences 22 (10), 1297-1300, 2006
社団法人 日本分析化学会
- Tweet
キーワード
詳細情報 詳細情報について
-
- CRID
- 1390282679235108864
-
- NII論文ID
- 130004441177
- 10018321691
-
- NII書誌ID
- AA10500785
-
- ISSN
- 13482246
- 09106340
-
- NDL書誌ID
- 8080225
-
- 本文言語コード
- en
-
- データソース種別
-
- JaLC
- NDL
- Crossref
- CiNii Articles
-
- 抄録ライセンスフラグ
- 使用不可