Application of Total Reflection X-ray Fluorescence Spectrometry to Small Glass Fragments

• NISHIWAKI Yoshinori

  Forensic Science Laboratory, Hyogo Prefectural Police Headquarters

• SHIMOYAMA Masahiko

  Forensic Science Laboratory, Hyogo Prefectural Police Headquarters

• NAKANISHI Toshio

  Forensic Science Laboratory, Hyogo Prefectural Police Headquarters

• NINOMIYA Toshio

  Japan Synchrotron Radiation Institute

• NAKAI Izumi

  Department of Applied Chemistry, Faculty of Science, Tokyo University of Science

Abstract

Total reflection X-ray fluorescence spectrometry (TXRF) has been applied for trace elemental analysis of small glass fragments. A small glass sample (a fragment with weight less than 0.5 mg) was decomposed by 100 µg of HF/HNO₃ acid; the material was condensed to 10 µl and was dried on a Si wafer. Since the size of the dried residue on the Si wafer was less than 1 cm in diameter, an incident X-ray beam with about 1 cm in width could effectively excite elemental components in such a small glass fragment. The precision of the present technique was checked by analyzing the glass fragments (< 0.5 mg) from NIST SRM612; the relative standard deviations (RSD) of less than 8.1% were achieved for elemental ratios that were normalized by Sr. Fragments (< 0.5 mg) obtained from 23 figured sheet glasses were used as samples for estimating the utility of this technique to forensic discrimination. Comparison of five elemental ratios of Ti/Sr, Mn/Sr, Zn/Sr, Rb/Sr, and Pb/Sr calculated from X-ray fluorescence spectra was effective in distinguishing glass fragments that could not be differentiated by their refractive indexes (RI).

Journal

• Analytical Sciences

  Analytical Sciences 22 (10), 1297-1300, 2006

  The Japan Society for Analytical Chemistry

Keywords

• Analytical Chemistry

Details

• CRID: 1390282679235108864
• NII Article ID: 130004441177
• NII Article ID: 10018321691
• NII Book ID: AA10500785
• DOI: 10.2116/analsci.22.1297
• ISSN: 13482246
• ISSN: 09106340
• NDL BIB ID: 8080225
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I8080225
• Web Site: https://link.springer.com/content/pdf/10.2116/analsci.22.1297.pdf
• Web Site: https://link.springer.com/article/10.2116/analsci.22.1297/fulltext.html
• Web Site: http://www.jstage.jst.go.jp/article/analsci/22/10/22_10_1297/_pdf
• Text Lang: en
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed