Microscopic Four-Point Atomic Force Microscope Probe Technique for Local Electrical Conductivity Measurement

• JU Y.

収録刊行物

• Rev. Sci. Instrum.

  Rev. Sci. Instrum. 76 (8), 3-, 2005

詳細情報

• CRID: 1570854175384010880
• NII論文ID: 10018345183
• データソース種別:
  • CiNii Articles