Composition Analysis of Atomistic Site Levels in ReSiAl

• Harada Shunta

  Kyoto University

• Terada Eiji

  Kyoto University

• Tanaka Katsushi

  Department of Materials Science and Engineerine, Kyoto University

• Kishida Kyosuke

  Department of Materials Science and Engineerine, Kyoto University

• Inui Haruyuki

  Department of Materials Science and Engineerine, Kyoto University

Bibliographic Information

Other Title

• ReSiAlの構造解析における原子サイト組成分析

Journal

• Materia Japan

  Materia Japan 45 (12), 870-870, 2006

  The Japan Institute of Metals and Materials

Keywords

• high angle annular dark field scanning transmission electron microscopy
• electron energy loss spectroscopy
• spherical aberration correction
• thermoelectric material

Details

• CRID: 1390001204078555648
• NII Article ID: 10018421941
• NII Book ID: AN10433227
• DOI: 10.2320/materia.45.870
• ISSN: 18845843
• ISSN: 13402625
• Web Site: https://www.jstage.jst.go.jp/article/materia1994/45/12/45_12_870/_pdf
• Data Source:
  • JaLC
  • Crossref
  • CiNii Articles