High-resolution Quantitative STEM-EDS Mapping in Y-Zirconia

• Suzuki Toshihiro

  Topcon Technohouse

• Moriyama Kazuhiko

  Topcon Technohouse

• Yanaka Takashi

  Topcon Technohouse

Bibliographic Information

Other Title

• Y添加ジルコニアの変調構造の定量元素分析

Journal

• Materia Japan

  Materia Japan 45 (12), 877-877, 2006

  The Japan Institute of Metals and Materials

Keywords

• scanning transmission electron microscope
• energy dispersive x-ray spectroscopy
• quantitative mapping

Details

• CRID: 1390282679055250816
• NII Article ID: 10018421957
• NII Book ID: AN10433227
• DOI: 10.2320/materia.45.877
• ISSN: 18845843
• ISSN: 13402625
• Web Site: https://www.jstage.jst.go.jp/article/materia1994/45/12/45_12_877/_pdf
• Data Source:
  • JaLC
  • Crossref
  • CiNii Articles