Improved Sensitivity of Optical Frequency Domain Reflectometry-Optical Coherence Tomography Using a Semiconductor Optical Amplifer

• Pachamuthu Jayavel

• Takuji Amano

• DongHak Choi

書誌事項

タイトル別名

• Improved Sensitivity of Optical Frequency Domain Reflectometry Optical Coherence Tomography Using a Semiconductor Optical Amplifer

収録刊行物

• Japanese journal of applied physics. Part 2, Letters & express letters

  Japanese journal of applied physics. Part 2, Letters & express letters 45 (46-50), L1317-1319, 2006-12

  Tokyo : Japan Society of Applied Physics

キーワード

• optical coherence tomography
• optical frequency domain reflectometry
• SSG-DBR laser

詳細情報

• CRID: 1524232505015270272
• NII論文ID: 10018461242
• NII書誌ID: AA11906093
• ISSN: 00214922
• NDL書誌ID: 8590268
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I8590268
• 本文言語コード: en
• NDL 雑誌分類:
  • ZM35(科学技術--物理学)
• データソース種別:
  • NDL
  • CiNii Articles